14th International Conference on Shot Peening
14th International Conference on Shot Peening
Jared Wheeler, Erik Novak
2020, 4D Technology Corp., Tucson, AZ, USA – jared.wheeler@ontoinnovation.com
Introduction
Current metrology methods of shot peened surfaces have many shortcomings. 2D stylus methods are directionally sensitive, can’t measure corners or edges, and offer small overall coverage. 3D microscopes have high resolution and good areal coverage, but cannot measure many parts due to the size or geometric complexity of the parts. This paper presents a high-resolution 3D optical measurement system for comprehensive, accurate, fast shop floor assessment of shot peen coverage on a wide variety of part geometries.
Objectives
To present the design, testing, and applications studies involving an easy-to-use, robust, gauge-capable measurement system that any inspector can use to assess shot peen coverage on a large range of materials and geometries.
19 Novembre 2022